Measurement Systems

  • LensAFM (Nanosurf)

Description : AFM for upright microscope
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual :

  • Bio AFM (Flex-Bio, Nanosurf)

Description : Bio AFM and patterning
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual : Nanosurf FlexAFM

  • AFM (NTEGRA, NT-MDT)

Description : AFM and NSOM (in air and vacuum)
Location : N7-4 Rm 5122
Manager : Taeyeong Kim
Manual : NT-MDT NTEGRA

  • STM (Naio STM, Nanosurf)

Description : Scanning tunneling microsocpe
Location : N7-4 Rm 5122
Manager : Taeyeong Kim
Manual : NaioSTM

  • Contact angle measurement (SmartDrop plus hs, Smartdrop)

Description : Contact angle, surface tension, surface energy measurement
Location : N7-4 Rm 5122
Manager : Taeyeong Kim
Manual : Smartdrop plus (Kor), Smartdrop plus (Eng)

  • High-speed camera (Phantom C110, Phantomhighspeed)

Description : High-speed photography / microscopy
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual : Phantom C110, Manual_Juhee Ko

  • High temperature probe station (Nextron)

Description : High temperature and vacuum probe station
Location : N7-4 Rm 5122
Manager : Muhammad Refatual Haq
Manual :