Measurement Systems

• micro-Raman spectrometer (Dongwoo optron)

Description : micro-Raman spectroscopy with upright optical microscope
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual :

• LensAFM (Nanosurf)

Description : AFM for upright microscope
Location : N7-4 Rm 3111
Manager : Kibum Jung
Manual : Nanosurf LensAFM
Spec :
Scan rage XY: 70µm x 70µm
Scan rage Z: 22µm
Z measurement noise level: typ.350pm, max. 500pm
Built-in 8x objective lens

• Bio AFM (Flex-Bio, Nanosurf)

Description : Bio AFM and patterning
Location : N7-4 Rm 3111
Manager : Kibum Jung
Manual : Nanosurf FlexAFM
Spec :
Scan rage XY: 100µm x 100µm
Scan rage Z: 10µm
XY drive resolution: 6pm
Z drive resolution: 0.6pm
Z measurement noise level: typ.35pm, max. 50pm

• AFM (NTEGRA, NT-MDT)

Description : AFM and NSOM (in air and vacuum)
Location : N7-4 Rm 5122
Manager : Taeyeong Kim
Manual : NT-MDT NTEGRA

• STM (Naio STM, Nanosurf)

Description : Scanning tunneling microsocpe
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual : NaioSTM

• Contact angle measurement (SmartDrop plus hs, Smartdrop)

Description : Contact angle, surface tension, surface energy measurement
Location : N7-4 (moved to Prof. Nam’s)
Manager : –
Manual : Smartdrop plus (Kor), Smartdrop plus (Eng)

• High-speed camera (Phantom C110, Phantomhighspeed)

Description : High-speed photography / microscopy
Location : N7-4 Rm 5122
Manager : Juhee Ko
Manual : Phantom C110, Manual_Juhee Ko

• High temperature probe station (Nextron)

Description : High temperature and vacuum probe station
Location : N7-4 Rm 5122
Manager : Kibum Jung
Manual :